[News Feed] NIST Finds Rough Spot In Surface Measurement

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In an upcoming issue of Applied Optics, NIST researchers report that roughness measurements made with white light interferometric microscopes differed by as much as 80 percent from those obtained with two other surface-profiling methods. The comparative study should be of interest to manufacturers of computer disk drives, semiconductors, and other sophisticated technologies that rely on smooth surfaces.

http://www.sciencedaily.com/releases...0726130414.htm