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Old 12-09-2004, 08:00   #1 (permalink)
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Post [News Feed] Purdue Engineers Create Model For Testing Transistor Reliability
Researchers at Purdue University have created a "unified model" for predicting the reliability of new designs for silicon transistors -- a potential tool that industry could use to save tens of millions of dollars annually in testing costs.

http://www.sciencedaily.com/releases...1130200944.htm
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